描述 Description

The TLC2272A and TLC2274A are dual and quadruple operational amplifiers from Texas Instruments. Both devices exhibit rail-to-rail output performance for increased dynamic range in single- or split-supply applications. The TLC227xA family offers 2 MHz of bandwidth and 3 V/μs of slew rate for higher speed applications. These devices offer comparable ac performance while having better noise, input offset voltage, and power dissipation than existing CMOS operational amplifiers. The TLC227xA has a noise voltage of 9 nV/Hz, two times lower than competitive solutions.

The TLC227xA, exhibiting high input impedance and low noise, is excellent for small-signal conditioning for high-impedance sources, such as piezoelectric transducers. Because of the micro-power dissipation levels, these devices work well in hand-held monitoring and remote-sensing applications. In addition, the rail-to-rail output feature, with single- or split-supplies, makes this family a great choice when interfacing with analog-to-digital converters (ADCs). For precision applications, the TLC227xA family has a maximum input offset voltage of 950 μV. This family is fully characterized at 5 V and ±5 V.

The TLC2272/4 also makes great upgrades to the TLC272/4 or TS272/4 in standard designs. They offer increased output dynamic range, lower noise voltage, and lower input offset voltage. This enhanced feature set allows them to be used in a wider range of applications.

特性 Features

? Controlled Baseline
? Extended Temperature Performance of –55°C to 125°C
? Enhanced Product Change Notification
? Output Swing Includes Both Supply Rails
? Low Input Bias Current ...1 pA Typ
? Common-Mode Input Voltage Range Includes Negative Rail
? High Slew Rate . . . 3.6 V/μs Typ
? Macromodel Included
? Performance Upgrades for the TS272, TS274, TLC272, and TLC274
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. Advanced LinCMOS is a trademark of Texas Instruments.