描述 Description

The THS4511 is a wideband, fully-differential operational amplifier designed for single-supply 5-V data-acquisition systems. It has very low noise at 2 nV/√Hz, and extremely low harmonic distortion of –72 dBc HD2 and –87 dBc HD3 at 70 MHz with 2 VPP, G?= 0 dB, and 200- load. Slew rate is very high at 4900 Vμs and with settling time of 3.3 ns to 1% (2 V step) it is ideal for pulsed applications. It is designed for minimum gain of 0 dB. To allow for dc coupling to analog-to-digital converters (ADCs), its unique output common-mode control circuit maintains the output common-mode voltage within 5-mV offset (typical) from the set voltage, when set within ±0.5 V of midsupply. The common-mode set point is set to midsupply by internal circuitry, which may be over-driven from an external source.The THS4511 is a high-performance amplifier that has been optimized for use in 5-V single-supply data acquisition systems. The output has been optimized for best performance with its common-mode voltages set to midsupply, and the input has been optimized for performance over a wide range of common-mode input voltages. High performance at a low power-supply voltage enables single-supply 5-V data-acquisition systems while minimizing component count. The THS4511 is offered in a quad, 16-pin leadless QFN package (RGT), and is characterized for operation over the full industrial temperature range from –40°C to +85°C.

特性 Features

? Fully-Differential Architecture
? Common-Mode Input Range Includes the Negative Rail
? Unity-Gain Stable
? Bandwidth: 1.6 GHz (Gain = 0 dB)
? Slew Rate: 4900 V/μs
? 1% Settling Time: 3.3 ns
? HD2: –72 dBc at 70 MHz
? HD3: –87 dBc at 70 MHz
? OIP2: 76 dBm at 70 MHz
? OIP3: 42 dBm at 70 MHz
? Input Voltage Noise: 2 nV/√Hz (f > 10 MHz)
? Noise Figure: 21.8 dB (50- System, G?=?6?dB)
? Output Common-Mode Control
? 5-V Power-Supply Current: 39.2 mA
? Power-Down Capability: 0.65 mA
? APPLICATIONS
? 5-V Data-Acquisition Systems
? High Linearity ADC Amplifiers
? Wireless Communication
? Medical Imaging
? Test and Measurement