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SN74LV74A-EP

DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS

FEATURES ·ControlledBaseline –OneAssembly/TestSite,OneFabrication Site ·ExtendedTemperaturePerformanceof–55°C to125°C ·EnhancedDiminishingManufacturing Sources(DMS)Support ·EnhancedProduct-ChangeNotification ·QualificationPedigree(1) ·2-Vto5.5-VVCCOperation

SN74LV74A-EP

增強(qiáng)型產(chǎn)品雙路正邊沿觸發(fā)式 D 型觸發(fā)器; ? Controlled Baseline \n? One Assembly/Test Site, One Fabrication Site\n \n? Extended Temperature Performance of -55°C to 125°C\n? Enhanced Diminishing Manufacturing Sources (DMS) Support\n? Enhanced Product-Change Notification\n? Qualification Pedigree\n? 2-V to 5.5-V VCC Operation\n? Max tpd of 13 ns at 5 V\n? Typical VOLP (Output Ground Bounce) CC = 3.3 V, TA = 25°C\n? Typical VOHV (Output VOH Undershoot) >2.3 V at VCC = 3.3 V, TA = 25°C\n? Supports Mixed-Mode Voltage Operation on All Ports\n? Ioff Supports Partial-Power-Down Mode Operation\n? Latch-Up Performance Exceeds 250 mA Per JESD 17\n? ESD Protection Exceeds JESD 22 \n? 2000-V Human-Body Model (A114-A)\n? 200-V Machine Model (A115-A)\n? 1000-V Charged-Device Model (C101)\n \n \nComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.;

These dual positive-edge-triggered D-type flip-flops are designed for 2-V to 5.5-V VCC operation. A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) inputs meeting the setup-time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down.

SN74LV74A-EP

DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP

SN74LV74A-EP

DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS

SN74LVC00ADR

TI/德州儀器
SOP14

TI/德州儀器