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SN74ABTH18652A

具有 18 位收發(fā)器和寄存器的掃描測試設(shè)備; ? Members of the Texas Instruments SCOPETM Family ofTestability Products? Members of the Texas Instruments WidebusTM Family? Compatible With the IEEE Standard 1149.1-1990 (JTAG) TestAccess Port and Boundary-Scan Architecture? Include D-Type Flip-Flops and Control Circuitry to ProvideMultiplexed Transmission of Stored and Real-Time Data? Bus Hold on Data Inputs Eliminates the Need for ExternalPullup Resistors? B-Port Outputs of 'ABTH182652A Devices Have Equivalent 25- Series Resistors, So NoExternal Resistors Are Required? State-of-the-Art EPIC-IIBTM BiCMOS Design? One Boundary-Scan Cell Per I/O Architecture Improves ScanEfficiency? SCOPETM Instruction Set? IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ? Parallel-Signature Analysis at Inputs? Pseudo-Random Pattern Generation From Outputs? Sample Inputs/Toggle Outputs? Binary Count From Outputs? Device Identification? Even-Parity Opcodes? Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV)Packages Using 25-mil Center-to-Center SpacingsSCOPE, Widebus, and EPIC-IIB are trademarks of TexasInstruments Incorporated.;

The 'ABTH18652A and 'ABTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.\nIn the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers and registers.\nData flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow, but uses CLKBA, SBA, and inputs. Since the input is active-low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 illustrates the four fundamental bus-management functions that are performed with the 'ABTH18652A and 'ABTH182652A. \n?\nIn the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.\nFour dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.\nImproved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction is also included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.\nActive bus-hold circuitry holds unused or floating data inputs at a valid logic level.\nThe B-port outputs of 'ABTH182652A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot. \nThe SN54ABTH18652A and SN54ABTH182652A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18652A and SN74ABTH182652A are characterized for operation from -40°C to 85°C.\n?\n?\n? \n

SN74ABTH18652A

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

SN74ABTH18652A

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

SN74ABTH18652APM

絲印：ABTH18652A；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

MembersoftheTexasInstruments SCOPE?FamilyofTestabilityProducts MembersoftheTexasInstruments. Widebus?Family CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture IncludeD-TypeFlip-FlopsandControl CircuitrytoProvideMult

SN74ABTH18652APM

SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

SN74ABTH18652APM

Package：64-LQFP；包裝：卷帶（TR）剪切帶（CT）Digi-Reel? 得捷定制卷帶 類別：集成電路（IC） 專用邏輯器件 描述：IC SCAN-TEST-DEV/TXRX 64-LQFP