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CD74HCT574

HIGH-SPEED CMOS LOGIC OCTAL D-TYPE FLIP-FLOP 3-STATE, POSITIVE-EDGE TRIGGERED

ControlledBaseline ?OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof ?40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProductChangeNotification QualificationPedigree? BufferedInputs Common3-StateOutput-EnableControl

CD74HCT574

HIGH-SPEED CMOS LOGIC OCTAL D-TYPE FLIP-FLOP 3-STATE, POSITIVE-EDGE TRIGGERED

QualifiedforAutomotiveApplications BufferedInputs Common3-StateOutput-EnableControl 3-StateOutputs Bus-LineDrivingCapability TypicalPropagationDelay(ClocktoQ): 15nsatVCC=5V,CL=15pF,TA=25
C Fanout(OverTemperatureRange) StandardOutputs...10LSTTLLoads Bu

CD74HCT574

具有三態(tài)輸出的高速 CMOS 邏輯八路正邊沿觸發(fā)式 D 型觸發(fā)器; ? Buffered Inputs\n? Common Three-State Output Enable Control\n? Three-State Outputs\n? Bus Line Driving Capability\n? Typical Propagation Delay (Clock to Q) = 15ns at VCC = 5V, CL = 15pF, TA = 25°C\n? Fanout (Over Temperature Range) \n? Standard Outputs...10 LSTTL Loads\n? Bus Driver Outputs...15 LSTTL Loads\n \n? Wide Operating Temperature Range...–55°C to 125°C\n? Balanced Propagation Delay and Transition Times\n? Significant Power Reduction Compared to LSTTL Logic ICs\n? HC Types \n? 2V to 6V Operation\n? High Noise Immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V\n \n? HCT Types \n? 4.5V to 5.5V Operation\n? Direct LSTTL Input Logic Compatibility, VIL = 0.8V (Max), VIH = 2V (Min)\n? CMOS Input Compatibility, Il 1μA at VOL, VOH\n \n Data sheet acquired from Harris Semiconductor;

The ?HC374, ?HCT374, ?HC574, and ?HCT574 are octal D-type flip-flops with 3-state outputs and the capability to drive 15 LSTTL loads. The eight edge-triggered flip-flops enter data into their registers on the LOW to HIGH transition of clock (CP). The output enable (OE) controls the 3-state outputs and is independent of the register operation. When OE is HIGH\\, the outputs are in the high-impedance state. The 374 and 574 are identical in function and differ only in their pinout arrangements.

CD74HCT574

High Speed CMOS Logic Octal D-Type Flip-Flop, Three-State Positive-Edge Triggered

CD74HCT574

High-Speed CMOS Logic Octal D-Type Flip-Flop, 3-State Positive-Edge Triggered

CD74HCT574

High-Speed CMOS Logic Octal D-Type Flip-Flop, 3-State Positive-Edge Triggered

CD74HCT574-EP

HIGH-SPEED CMOS LOGIC OCTAL D-TYPE FLIP-FLOP 3-STATE, POSITIVE-EDGE TRIGGERED

ControlledBaseline ?OneAssembly/TestSite,OneFabrication Site ExtendedTemperaturePerformanceof ?40°Cto125°C EnhancedDiminishingManufacturing Sources(DMS)Support EnhancedProductChangeNotification QualificationPedigree? BufferedInputs Common3-StateOutput-EnableControl

CD74HCT574-EP

HIGH-SPEED CMOS LOGIC OCTAL D-TYPE FLIP-FLOP 3-STATE, POSITIVE-EDGE TRIGGERED

QualifiedforAutomotiveApplications BufferedInputs Common3-StateOutput-EnableControl 3-StateOutputs Bus-LineDrivingCapability TypicalPropagationDelay(ClocktoQ): 15nsatVCC=5V,CL=15pF,TA=25
C Fanout(OverTemperatureRange) StandardOutputs...10LSTTLLoads Bu

CD74HCT574-EP

增強型產(chǎn)品高速 Cmos 邏輯八路正邊沿觸發(fā)式 D 型觸發(fā)器，具有; ? Controlled Baseline \n? One Assembly/Test Site, One Fabrication Site\n \n? Extended Temperature Performance of –40°C to 125°C\n? Enhanced Diminishing Manufacturing Sources (DMS) Support\n? Enhanced Product Change Notification\n? Qualification Pedigree\n? Buffered Inputs\n? Common 3-State Output-Enable Control\n? 3-State Outputs\n? Bus-Line Driving Capability\n? Typical Propagation Delay (Clock to Q): ???15 ns at VCC = 5 V, CL = 15 pF, TA = 25°C\n? Fanout (Over Temperature Range) \n? Standard Outputs . . . 10 LSTTL Loads\n? Bus Driver Outputs . . . 15 LSTTL Loads\n \n? Balanced Propagation Delay and Transition Times\n? Significant Power Reduction Compared to LSTTL Logic ICs\n? VCC Voltage = 4.5 V to 5.5 V\n? Direct LSTTL Input Logic Compatibility, VIL = 0.8 V (Max), VIH = 2 V (Min)\n? CMOS Input Compatibility, Il ≤ 1 μA at VOL, VOH\n Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.;

The CD74HCT574 is an octal D-type flip-flop with 3-state outputs and the capability to drive 15 LSTTL loads. The eight edge-triggered flip-flops enter data into their registers on the low-to-high transition of the clock (CP). The output enable (OE)\\ controls the 3-state outputs and is independent of the register operation. When OE\\ is high, the outputs are in the high-impedance state.

CD74HCT574-Q1

HIGH-SPEED CMOS LOGIC OCTAL D-TYPE FLIP-FLOP 3-STATE, POSITIVE-EDGE TRIGGERED

QualifiedforAutomotiveApplications BufferedInputs Common3-StateOutput-EnableControl 3-StateOutputs Bus-LineDrivingCapability TypicalPropagationDelay(ClocktoQ): 15nsatVCC=5V,CL=15pF,TA=25
C Fanout(OverTemperatureRange) StandardOutputs...10LSTTLLoads Bu