FEATURES

? Complete 16-bit data acquisition system

? Simultaneous sampling of 8 internally buffered channels

? 250 kSPS per channel throughput

? Differential, wide common-mode range inputs

? ±75 pA typical input leakage at 25°C

? Full-scale input step settling time < 300 ns

? Integrated reference and reference buffer (4.096 V)

? Integrated supply decoupling capacitors

? 27 mW per channel at 250 kSPS, scales with throughput

? Minimal external signal conditioning

? Seamless high dynamic range

? Per sample, per channel automatic gain ranging

? Maintains ppm-level INL

? Per channel SoftSpan input ranges, bipolar or unipolar

? ±40 V, ±25 V, ±20 V, ±12.5 V, ±10 V, ±6.25 V, ±5 V, ±2.5 V

? 0 V to 40 V, 25 V, 20 V, 12.5 V, 10 V, 6.25 V, 5 V, 2.5 V

? Rail-to-rail input overdrive tolerance

? High performance

? INL: ±160 μV typical (±40 V range)

? SNR: 94.6 dB single-conversion typical (±40 V range)

? DR: 98.1 dB single-conversion typical (±40 V range)

? THD: ?117 dB typical (±40 V range)

? CMRR: 120 dB typical

? Digital flexibility

? SPI CMOS (0.9 V to 5.25 V) and LVDS serial input and output

? Optional oversampling with 16-bit digital averaging

? Optional offset, gain, and phase correction

? 7.00 mm × 7.00 mm, 64-ball BGA full solution footprint

APPLICATIONS

? Automatic test equipment

? Avionics and aerospace

? Instrumentation and control systems

? Semiconductor manufacturing

? Test and measurement