FEATURES

? High performance

? Throughput: 40 MSPS, 46.25 ns conversion latency

? INL: ±4 ppm (typical), ±8 ppm (maximum)

? SNR/THD

? 93.6 dB (typical)/?110 dB (typical) at fIN = 1 kHz

? 93.5 dB (typical)/?104 dB (typical) at fIN = 1 MHz

? Noise spectral density: ?167.6 dBFS/Hz

? 20-bit resolution, no missing codes

? Low power

? 79.3 mW typical at 40 MSPS with ?0.5 dBFS sine-wave input

? Easy Drive, fully differential Input

? 6 V p-p differential input range

? Continuous signal acquisition

? Linearized, 5 μA/MSPS input current

? Integrated, low-drift reference buffer and decoupling

? Integrated VCM generation

? Digital features and data interface

? Conversion result FIFO, 16K sample depth

? Digital averaging filter with up to 210 decimation

? SPI configuration

? Configurable data interface

? Single lane, DDR, serial LVDS, 800 MBPS per lane

? Dual lane, DDR, serial LVDS, 400 MBPS per lane

? Single/quad lane SPI data interface

? Package

? 49-ball, 5 mm x 5 mm CSP_BGA, 0.65 mm pitch

? Integrated supply decoupling capacitors

? Operating temperature range: ?40°C to +85°C

APPLICATIONS

? Digital imaging

? Cell analysis

? Spectroscopy

? Automated test equipment

? High speed data acquisition

? Digital control loops, hardware in the loop

? Power quality analysis

? Source measurement units

? Electron and x-ray microscopy

? Radar level measurement

? Nondestructive test

? Predictive maintenance and structural health