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ABTH18502A

型號：SN74ABTH18502APMR；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPort andBoundary-ScanArchitecture UBTE(UniversalBusTransceiver) CombinesD-TypeLatchesandD-Typ

ABTH18646A

型號：SN74ABTH18646APM；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

MembersoftheTexasInstruments SCOPEEFamilyofTestabilityProducts MembersoftheTexasInstruments WidebusEFamily CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture IncludeD-TypeFlip-FlopsandControl CircuitrytoProvideMultiplex

ABTH18652A

型號：SN74ABTH18652APM；Package：LQFP；SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS

MembersoftheTexasInstruments SCOPE?FamilyofTestabilityProducts MembersoftheTexasInstruments. Widebus?Family CompatibleWiththeIEEEStandard 1149.1-1990(JTAG)TestAccessPortand Boundary-ScanArchitecture IncludeD-TypeFlip-FlopsandControl CircuitrytoProvideMult

ABTH32245

型號：SN74ABTH32245PZ；Package：LQFP；36-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

MembersoftheTexasInstruments Widebus+EFamily State-of-the-ArtEPIC-IIBEBiCMOSDesign SignificantlyReducesPowerDissipation Latch-UpPerformanceExceeds500mAPer JEDECStandardJESD-17 TypicalVOLP(OutputGroundBounce)